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  november 2007 hyb25d512[40/80/16]0b[c/t](l) hyb25d512[40/80/16]0b[e/f](l) 512-mbit double-data-rate sdram ddr sdram internet data sheet rev. 1.70
we listen to your comments any information within this document that yo u feel is wrong, unclear or missing at all? your feedback will help us to continuous ly improve the quality of this document. please send your proposal (including a reference to this document) to: techdoc@qimonda.com internet data sheet hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram qag_techdoc_rev400 / 3.2 qag / 2006-08-01 2 03062006-pffj-yjy2 hyb25d512[40/80/16]0b[c/t](l), hy b25d512[40/80/16]0b[e/f](l) revision history: 2007-11, rev. 1.70 page subjects (major chan ges since last revision) all adapted internet version all editorial change 88,89 corrected package outline previous revision: rev. 1.63, 2006-09 all qimonda update previous revision: rev. 1.62, 2005-10
internet data sheet rev. 1.70, 2007-11 3 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram 1overview this chapter gives an overview of the 512-mbit doubl e-data-rate sdram product family and describes its main characteristics 1.1 features ? double data rate architecture: tw o data transfers per clock cycle ? bidirectional data strobe (dqs) is transmitted and received with data, to be used in capturing data at the receiver ? dqs is edge-aligned with data for reads and is center-aligned with data for writes ? differential clock inputs (ck and ck ) ? four internal banks for concurrent operation ? data mask (dm) for write data ? dll aligns dq and dqs transitions with ck transitions ? commands entered on each positive ck edge; data and data mask referenced to both edges of dqs ? burst lengths: 2, 4, or 8 ? cas latency: (1.5), 2, 2.5, 3 ? auto pre charge option for each burst access ? auto refresh and self refresh modes ? ras-lockout supported t rap = t rcd ?7.8 s maximum average periodic refresh interval ? 2.5 v (sstl_2 compatible) i/o ? v ddq = 2.5 v 0.2 v and 2.6 v 0.1 v for ddr400 ? v dd = 2.5 v 0.2 v and 2.6 v 0.1 v for ddr400 ? p(g)-tfbga-60 and p(g)-tsopii-66 package table 1 performance part number speed code ?5 ?6 ?7 unit speed grade component ddr400b ddr333b ddr266a ? max. clock frequency @cl3 f ck3 200 166 ? mhz @cl2.5 f ck2.5 166 166 143 mhz @cl2 f ck2 133 133 133 mhz
internet data sheet rev. 1.70, 2007-11 4 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram 1.2 description the 512-mbit double-data-rate sdram is a high-speed cmos, dynamic random-access memory containing 536,870,912 bits. it is internal ly configured as a quad-bank dram. the 512-mbit double-data-rate sdram uses a double- data-rate architecture to ac hieve high-speed operation. the double data rate architecture is essentially a 2n pre fetch architecture with an interface designed to transfer two data words per clock cycle at the i/o pins. a single read or write access for the 512-mbit double-data-rate sdram effectively consists of a single 2n -bit wide, one clock cycle data transfer at the internal dram core and two corresponding n-bit wide, one-ha lf-clock-cycle data transfers at the i/o pins. a bidirectional data strobe (d qs) is transmitted externally, along with data, for use in data capture at the receiver. dqs is a strobe transmitted by the ddr sdram during reads and by the memory controller dur ing writes. dqs is edge-aligned with data for reads and center-a ligned with data for writes. the 512-mbit double-data-rate sdram operates from a differential clock (ck and ck ; the crossing of ck going high and ck going low is referred to as the positive edge of ck). commands (address and control signals) are registered at every positive edge of ck. input data is registered on both edges of dqs, and output data is referenced to both edges of dqs, as well as to both edges of ck. read and write accesses to the ddr sdram are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. accesses begin with the registration of an active command, which is then followed by a read or write command. the address bits registered coincident with the active command are used to select the bank and row to be accessed. the address bits registered coincident with the read or write command are used to select the bank and the starting column location for the burst access. the ddr sdram provides for programmable read or write burst lengths of 2, 4 or 8 locations. an auto precharge function may be enabled to provide a self-timed row precharge that is initiated at the end of the burst access. as with standard sdrams, the pipelined, multibank architecture of ddr sdrams allows for concurrent operation, thereby providing high effective bandwidth by hiding row precharge and activation time. an auto refresh mode is provided along with a power-saving power-down mode. all inputs are compatible with the industry standard for sstl_2. all out puts are sstl_2, class ii compatible. note: the functionality described and the timi ng specifications included in this dat a sheet are for the dll enabled mode of operation.
internet data sheet rev. 1.70, 2007-11 5 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 2 ordering information part number 1) 1) hyb: designator for memory components 25d: ddr sdrams at v ddq = 2.5 v 512: 512-mbit density 400/800/160: product variations x4, 8 and 16 b: die revision b c/f/e/t: package type fbga and tsop l: low power (on request) org. cas-rcd-rp latencies clock (mhz) cas-rcd-rp latencies clock (mhz) speed package hyb25d512800bt?5 8 3.0-3-3 200 2.5-3-3 166 ddr400b p-tsopii-66 hyb25d512160bt?5 16 hyb25d512400bt?6 4 2.5-3-3 166 2-3-3 133 ddr333 hyb25d512800bt?6 8 hyb25d512160bt?6 16 hyb25d512160btl?6 16 hyb25d512400bt?7 4 143 ddr266 hyb25d512400bc?5 4 3.0-3-3 200 2.5-3-3 166 ddr400b p-tfbga-60 hyb25d512800bc?5 8 hyb25d512160bc?5 16 hyb25d512400bc?6 4 2.5-3-3 166 2-3-3 133 ddr333 hyb25d512800bc?6 8 hyb25d512160bc?6 16
internet data sheet rev. 1.70, 2007-11 6 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 3 ordering information for rohs compliant products part number org. cas-rcd-rp latencies clock (mhz) cas-rcd-rp latencies clock (mhz) speed package hyb25d512400bf?5 4 3.0-3-3 200 2.5-3-3 166 ddr400b pg-tfbga-60 hyb25d512800bf?5 8 hyb25d512160bf?5 16 hyb25d512400bf?6 4 2.5-3-3 166 2-3-3 133 ddr333 hyb25d512800bf?6 8 hyb25d512160bf?6 16 hyb25d512400be?5 4 3.0-3-3 200 2.5-3-3 166 ddr400b pg-tsopii-66 hyb25d512800be?5 8 hyb25d512160be?5 16 hyb25d512400be?6 4 2.5-3-3 166 2-3-3 133 ddr333 hyb25d512800be?6 8 hyb25d512800bel?6 8 hyb25d512160be?6 16 hyb25d512160bel?6 16 hyb25d512400be?7 4 143 ddr266a
internet data sheet rev. 1.70, 2007-11 7 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram 2 pin configuration the pin configuration of a ddr sdram is listed by function in table 4 (60 pins). the abbreviations used in the pin#/buffer# column are explained in table 5 and table 6 respectively. the pin numbering for fbga is depicted in figure 1 and that of the tsop package in figure 2 table 4 pin configuration of ddr sdram ball#/pin# name pin type buffer type function clock signals g2, 45 ck i sstl clock signal note: ck and ck are differential clock inputs. all address and control input signals are sampled on the crossing of the positive edge of ck and negative edge of ck . output (read) data is referenced to the crossings of ck and ck (both directions of crossing). g3, 46 ck i sstl complementary clock signal h3, 44 cke i sstl clock enable: cke high activates, and cke low deactivates, internal clock signals and device input buffer s and output driver s. taking cke low provides precharge power-down and self refresh operation (all banks idle), or active power-down (row active in any bank). cke is synchronous for power down entry and exit, and for self refresh entry. cke is asynchronous for self refresh exit. cke must be maintained high throughout read and write accesses. input buffers, excluding ck, ck and cke are disabled during power-down. input buffers, excluding cke, are disabled during self refresh. cke is an sstl_2 input, but will detect an lvcmos low level after v dd is applied on first power up. after v ref has become stable during the power on and initialization sequence, it must be mantained for proper operation of the cke receiver. for proper self- refresh entry and exit, v ref must be mantained to this input. control signals h7, 23 ras i sstl row address strobe g8, 22 cas i sstl column address strobe g7, 21 we i sstl write enable h8, 24 cs i sstl chip select note: all commands are masked when cs is registered high. cs provides for external bank sele ction on systems with multiple banks. cs is considered part of the command code. the standard pinout includes one cs pin. address signals j8, 26 ba0 i sstl bank address bus 2:0 note: ba0 and ba1 define to which bank an active, read, write or precharge command is being applied. ba0 and ba1 also determines if the mode register or extended mode register is to be accessed during a mrs or emrs cycle. j7, 27 ba1 i sstl
internet data sheet rev. 1.70, 2007-11 8 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram k7, 29 a0 i sstl address bus 11:0 l8, 30 a1 i sstl l7, 31 a2 i sstl m8, 32 a3 i sstl m2, 35 a4 i sstl l3, 36 a5 i sstl l2, 37 a6 i sstl k3, 38 a7 i sstl k2, 39 a8 i sstl j3, 40 a9 i sstl k8, 28 a10 i sstl ap i sstl j2, 41 a11 i sstl h2, 42 a12 i sstl address signal 12 note: 256 mbit or larger dies nc nc ? note: 128 mbit or smaller dies f9, 17 a13 i sstl address signal 13 note: 1 gbit based dies nc nc ? note: 512 mbit or smaller dies data signals 4 organization b7, 5 dq0 i/o sstl data signal 3:0 d7, 11 dq1 i/o sstl d3, 56 dq2 i/o sstl b3, 62 dq3 i/o sstl data strobe 4 organisation e3, 51 dqs i/o sstl data strobe data mask 4 organization f3, 47 dm i sstl data mask data signals 8 organization a8, 2 dq0 i/o sstl data signal 7:0 b7, 5 dq1 i/o sstl c7, 8 dq2 i/o sstl d7, 11 dq3 i/o sstl d3, 56 dq4 i/o sstl c3, 59 dq5 i/o sstl data signal b3, 62 dq6 i/o sstl a2, 65 dq7 i/o sstl ball#/pin# name pin type buffer type function
internet data sheet rev. 1.70, 2007-11 9 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram data strobe 8 organisation e3, 51 dqs i/o sstl data strobe note: output with read data, input with write data. edge-aligned with read data, centered in write data . used to capture write data. data mask 8 organization f3, 47 dm i sstl data mask note: dm is an input mask signal for write data. input data is masked when dm is sampled high coincid ent with that in put data during a write access. dm is sampled on both edges of dqs. although dm pins are input only, the dm loading matches the dq and dqs loading. data signals 16 organization a8, 2 dq0 i/o sstl data signal 15:0 b9, 4 dq1 i/o sstl b7, 5 dq2 i/o sstl c9, 7 dq3 i/o sstl c7, 8 dq4 i/o sstl d9, 10 dq5 i/o sstl d7, 11 dq6 i/o sstl e9, 13 dq7 i/o sstl e1, 54 dq8 i/o sstl d3, 56 dq9 i/o sstl d1, 57 dq10 i/o sstl c3, 59 dq11 i/o sstl c1, 60 dq12 i/o sstl b3, 62 dq13 i/o sstl b1, 63 dq14 i/o sstl a2, 65 dq15 i/o sstl data strobe 16 organization e3, 51 udqs i/o sstl data strobe upper byte e7, 16 ldqs i/o sstl data strobe lower byte data mask 16 organization f3, 47 udm i sstl data mask upper byte f7, 20 ldm i sstl data mask lower byte power supplies f1, 49 v ref ai ? i/o reference voltage a9, b2, c8, d2, e8, 3, 9, 15, 55, 61 v ddq pwr ? i/o driver power supply a7, f8, m7, 1, 18, 33 v dd pwr ? power supply ball#/pin# name pin type buffer type function
internet data sheet rev. 1.70, 2007-11 10 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram a1, b8, c2, d8, e2, 6, 12, 52, 58, 64 v ssq pwr ? power supply a3,f2, m3, 34, 48, 66, v ss pwr ? power supply not connected a2, 65 nc nc ? not connected note: 4 organization a8, 2 nc nc ? not connected note: 4 organization b1, 63 nc nc ? not connected note: 8 and 4 organisation b9, 4 nc nc ? not connected note: 8 and 4 organization c1, 60 nc nc ? not connected note: 8 and 4 organization c3, 59 nc nc ? not connected note: 4 organization c7, 8 nc nc ? not connected note: 4 organization c9, 7 nc nc ? not connected note: 8 and 4 organization d1, 57 nc nc ? not connected note: 8 and 4 organization d9, 10 nc nc ? not connected note: 8 and 4 organization e1, 54 nc nc ? not connected note: 8 and 4 organization e7, 16 nc nc ? not connected note: 8 and 4 organization e9, 13 nc nc ? not connected note: 8 and 4 organization f7, 20 nc nc ? not connected note: 8 and 4 organization f9, 14, 17, 19, 25,43, 50, 53 nc nc ? not connected note: 16, 8 and 4 organization ball#/pin# name pin type buffer type function
internet data sheet rev. 1.70, 2007-11 11 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 5 abbreviations for pin type table 6 abbreviations for buffer type abbreviation description i standard input-only pin. digital levels. o output. digital levels. i/o i/o is a bidirectional input/output signal. ai input. analog levels. pwr power gnd ground nc not connected abbreviation description sstl serial stub terminated logic (sstl2) lv-cmos low voltage cmos cmos cmos levels od open drain. the corresponding pin has 2 operat ional states, active low and tristate, and allows multiple devices to share as a wire-or.
internet data sheet rev. 1.70, 2007-11 12 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram figure 1 pin configuration p-tfbga-60 top view , see the balls throught the package      

          
 
 
 
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internet data sheet rev. 1.70, 2007-11 13 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram figure 2 pin configuration p-tsopii-66-1                                                                    
  
 

 
  

 
 
 
 

  
 
                        
  
 
 
  
 
  
  
  
                           
 
 
  
   
  
  
                         
  
 

 
  

 
 
 
  

  
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internet data sheet rev. 1.70, 2007-11 14 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 7 input/output functional description symbol type function ck, ck input clock: ck and ck are differential clock inputs. all address and control input signals are sampled on the crossing of the pos itive edge of ck and negative edge of ck . output (read) data is referenced to the crossings of ck and ck (both directions of crossing). cke input clock enable: cke high activates, and cke low deactivates, internal clock signals and device input buffers and output drivers. taking c ke low provides precharge power-down and self refresh operation (all banks idle), or active power-down (row active in any bank). cke is synchronous for power down entry and exit, and for self refresh entry. cke is asynchronous for self refresh exit. cke must be maintained high throughout read and write accesses. input buffers, excluding ck, ck and cke are disabled during power-down. input buffers, excluding cke, are disabled during self refresh. cke is an sstl_2 input, but wil l detect an lvcmos low level after v dd is applied on first power up. after v ref has become stable during the power on and initialization sequence, it mu st be mantained for proper op eration of the cke receiver. for proper self-refresh entry and exit, v ref must be mantained to this input. cs input chip select: all commands are masked when cs is registered high. cs provides for external bank selection on systems with multiple banks. cs is considered part of the command code. the standard pinout includes one cs pin. ras , cas , we input command inputs: ras , cas and we (along with cs ) define the command being entered. dm input input data mask: dm is an input mask signal for write data. input data is masked when dm is sampled high coincident with t hat input data during a write access. dm is sampled on both edges of dqs. although dm pins are input only, the dm loading matches the dq and dqs loading. ba0, ba1 input bank address inputs: ba0 and ba1 define to which bank an active, read, write or precharge command is being applied. ba0 and ba1 also determines if the mode register or extended mode register is to be accessed during a mrs or emrs cycle. a0 - a12 input address inputs: provide the row address for active commands, and the column address and auto precharge bit for read/write commands, to select one location out of the memory array in the respective bank. a10 is sampled during a precharge command to determine whether the precharge applies to one bank (a10 low) or all banks (a10 high). if only one bank is to be precharged, the bank is selected by ba0, ba1. the address inputs also provide the op-code during a mode register set command. dq input/output data input/output: data bus. dqs input/output data strobe: output with read data, input with write data. edge-aligned with read data, centered in write data. used to capture write data. n.c. ? no connect: no internal electrical connection is present. v ddq supply dq power supply: 2.5 v 0.2 v and 2.6 v 0.1 v for ddr400 v ssq supply dq ground v dd supply power supply: 2.5 v 0.2 v and 2.6 v 0.1 v for ddr400 v ss supply ground v ref supply sstl_2 reference voltage: ( v ddq /2)
internet data sheet rev. 1.70, 2007-11 15 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram 3 functional description field bits type description bl [2:0] w burst length number of sequential bits per dq related to one read/write command. note: all other bit combinations are reserved. 001 b 2 010 b 4 011 b 8 bt 3w burst type 0 b sequential 1 b interleaved cl [6:4] w cas latency number of full clocks from read command to first data valid window. note: all other bit combinations are reserved. 010 b 2 011 b 3 101 b (1.5 optional, not covered by this data sheet) 110 b 2.5 mode [12:7] w operating mode note: all other bit combinations are reserved. 000000 b normal operation without dll reset 000010 b dll reset % $ % $ $  $  $  $ $ $ $ $ $ $ $ $ $  2 s h u d w l q j  0 2 ' ( % / & / % 7  u h j   d g g u z z z z
internet data sheet rev. 1.70, 2007-11 16 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram field bits type description dll 0w dll status 0 b enabled 1 b disabled ds 1w drive strength 0 b normal 1 b weak mode [12:2] w operating mode note: all other bit combinations are reserved. 0 b normal operation %$ %$ $ $ $ $ $ $ $ $ $ $ $ $  02'( '6  '// $
internet data sheet rev. 1.70, 2007-11 17 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 8 truth table 1a: commands table 9 truth table 1b: dm operation name (function) cs ras cas we address mne notes deselect (nop) hxxxx nop 1)2) 1) cke is high for all commands shown except self refresh. v ref must be maintained during self refresh operation 2) deselect and nop are functionally interchangeable. no operation (nop) lhhhx nop 1)2) active (select bank and activate row) l l h h bank/row act 1)3) 3) ba0-ba1 provide bank address and a0-a12 provide row address. read (select bank and column, and start read burst) l h l h bank/col read 1)4) 4) ba0, ba1 provide bank address; a0-ai provide column address (where i = 8 for 16, i = 9 for 8 and 9, 11 for 4); a10 high enables the auto precharge feature (non persi stent), a10 low disables the auto precharge feature. write (select bank and column, and start write burst) l h l l bank/col write 1)4) burst terminate lhhlx bst 1)5) 5) applies only to read bursts with auto precharge disabled; th is command is undefined (and should not be used) for read bursts with auto precharge enabled or for write bursts. precharge (deactivate row in bank or banks) l l h l code pre 1)6) 6) a10 low: ba0, ba1 determ ine which bank is precharged. a10 high: all banks are precharged and ba0, ba1 are ?don?t care?. auto refresh or self refres h (enter self refresh mode) lllhx ar/sr 1)7)8) 7) this command is auto refresh if cke is high; self refresh if cke is low. 8) internal refresh counter controls row and bank addressi ng; all inputs and i/os are ?don?t care? except for cke. mode register set llllop-codemrs 1)9) 9) ba0, ba1 select either the base or the extended mode register ( ba0 = 0, ba1 = 0 selects mode register; ba0 = 1, ba1 = 0 selects extended mode register; other combinations of ba0-ba1 are reserv ed; a0-a12 provide the op-code to be written to the selected mo de register). name (function) dm dqs notes write enable l valid 1) 1) used to mask write data; provided coincident with the corresponding data. write inhibit hx 1)
internet data sheet rev. 1.70, 2007-11 18 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 10 truth table 2: clock enable (cke) notes 1. cken is the logic state of cke at clock edge n: ck e n-1 was the state of cke at the previous clock edge. 2. current state is the state of the ddr sdram immediately prior to clock edge n. 3. command n is the command registered at clock edge n, and action n is a result of command n. 4. all states and sequences not shown are illegal or reserved. current state cke n-1 cke n command n action n notes previous cycle current cycle self refresh l l x maintain self-refresh 1) 1) v ref must be maintained during self refresh operation self refresh l h deselect or nop exit self-refresh 2) 2) deselect or nop commands should be issued on any clock edges occurri ng during the self refresh exit ( t xsnr ) period. a minimum of 200 clock cycles are needed before applying a read command to allow the dll to lock to the input clock. power down l l x maintain power-down ? power down l h deselect or nop exit power-down ? all banks idle h l deselect or nop precharge power-down entry ? all banks idle h l auto refresh self refresh entry ? bank(s) active h l deselect or nop active power-down entry ? hhsee table 11 ??
internet data sheet rev. 1.70, 2007-11 19 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 11 truth table 3: current state bank n - command to bank n (same bank) current state cs ras cas we command action notes any h x x x deselect nop. continue previous operation. 1)2)3)4)5)6) 1) this table applies when cke n-1 was high and cke n is high (see table 10 and after t xsnr / t xsrd has been met (if the previous state was self refresh). 2) this table is bank-specific, ex cept where noted, i.e., the current state is for a specific bank and the commands shown are th ose allowed to be issued to that bank when in that state. exceptions are covered in the notes below. 3) current state definitions: idle: the bank has been precharged, and t rp has been met. row active: a row in the bank has been activated, and t rcd has been met. no data bursts/accesses and no register accesses are in progress. read: a read burst has been initiated, with auto prechar ge disabled, and has not yet terminated or been terminated. write: a write burst has been initiated, with auto prechar ge disabled, and has not yet terminated or been terminated. 4) the following states must not be interru pted by a command issued to the same bank. pre charging: starts with registration of a precharge command and ends when t rp is met. once t rp is met, the bank is in the idle state. row activating: starts with regist ration of an active command and ends when t rcd is met. once t rcd is met, the bank is in the ?row active? state. read w/auto precharge enabled: starts with registration of a read command with auto precharge enabled and ends when t rp has been met. once t rp is met, the bank is in the idle state. write w/auto precharge enabled: starts wi th registration of a write command with auto precharge enabled and ends when t rp has been met. once t rp is met, the bank is in the idle state. deselect or nop commands, or allowable commands to the other bank should be issued on any clock edge occurring during these sta tes. allowable commands to the other bank are deter mined by its current state and according to table 12 . 5) the following states must not be interrupted by any execut able command; deselect or nop commands must be applied on each posi tive clock edge during these states. refreshing: starts with registration of an auto refresh command and ends when t rfc is met. once t rfc is met, the ddr sdram is in the ?all banks idle? state. accessing mode register: starts with registration of a mode register set command and ends when t mrd has been met. once t mrd is met, the ddr sdram is in the ?all banks idle? state. pre charging all: starts with registra tion of a precharge all command and ends when t rp is met. once t rp is met, all banks is in the idle state. 6) all states and sequences not shown are illegal or reserved. l h h h no operation nop. contin ue previous operation. 1) to 6) idle l l h h active select and activate row 1) to 6) l l l h auto refresh ? 1) to 7) 7) not bank-specific; requires that all banks are idle. l l l l mode register set ? 1) to 7) row active l h l h read select column and start read burst 1) to 6), 8) 8) reads or writes listed in the command/action column include read s or writes with auto precharge enabled and reads or writes w ith auto precharge disabled. l h l l write select column and start write burst 1) to 6), 8) l l h l precharge deactivate row in bank(s) 1) to 6), 9) 9) may or may not be bank-specific; if al l/any banks are to be precharged, all/any must be in a valid state for pre charging. read (auto precharge disabled) l h l h read select column and start new read burst 1) to 6), 8) l l h l precharge truncate read burst, start precharge 1) to 6), 9) l hhl burst terminate burst terminate 1) to 6), 10) write (auto precharge disabled) l h l h read select column and start read burst 1) to 6), 8), 11) l h l l write select column and start write burst 1) to 6), 8) l l h l precharge truncate write burst, start precharge 1) to 6), 9), 11)
internet data sheet rev. 1.70, 2007-11 20 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 12 truth table 4: current state bank n - command to bank m (different bank) 10) not bank-specific; burst terminate affects th e most recent read burst, regardless of bank. 11) requires appropriate dm masking. current state cs ras cas we command action notes any h x x x deselect nop. conti nue previous operation. 1)2)3)4)5)6) 1) this table applies when cke n-1 was high and cke n is high (see table 10 : clock enable (cke) and after t xsnr / t xsrd has been met (if the previous state was self refresh). 2) this table describes alternate bank opera tion, except where noted, i.e., the current state is for bank n and the commands sho wn are those allowed to be issued to bank m (assuming that bank m is in such a state that the given command is allowable). exceptions are co vered in the notes below. 3) current state definitions: idle: the bank has been precharged, and t rp has been met. row active: a row in the bank has been activated, and t rcd has been met. no data bursts/accesses and no register accesses are in progress. read: a read burst has been initiated, with auto prechar ge disabled, and has not yet terminated or been terminated. write: a write burst has been initiated, with auto prechar ge disabled, and has not yet terminated or been terminated. read with auto precharge enabled: see 10) . write with auto precharge enabled: see 10) . 4) auto refresh and mode register set commands may only be issued when all banks are idle. 5) a burst terminate command cannot be issued to another bank; it applies to the bank represented by the current state only. 6) all states and sequences not shown are illegal or reserved. l h h h no operation nop. continue previous operation. 1) to 6) idle xxxxany command otherwise allowed to bank m ? 1) to 6) row activating, active, or pre charging l l h h active select and activate row 1) to 6) l h l h read select column and start read burst 1) to 7) l h l l write select column and start write burst 1) to 7) l lhlprecharge ? 1) to 6) read (auto precharge disabled) l l h h active select and activate row 1) to 6) l h l h read select column and start new read burst 1) to 7) l lhlprecharge ? 1) to 6) write (auto precharge disabled) l l h h active select and activate row 1) to 6) l h l h read select column and start read burst 1) to 8) l h l l write select column and start new write burst 1) to 7) l lhlprecharge ? 1) to 6) read (with auto precharge) l l h h active select and activate row 1) to 6) l h l h read select column and start new read burst 1) to 7), 9) l h l l write select column and start write burst 1) to 7), 9), 10) l lhlprecharge ? 1) to 6) write (with auto precharge) l l h h active select and activate row 1) to 6) l h l h read select column and start read burst 1) to 7), 9) l h l l write select column and start new write burst 1) to 7), 9) l lhlprecharge ? 1) to 6)
internet data sheet rev. 1.70, 2007-11 21 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 13 truth table 5: concurrent auto precharge 7) reads or writes listed in the command/action column include read s or writes with auto precharge enabled and reads or writes w ith auto precharge disabled. 8) requires appropriate dm masking. 9) concurrent auto precharge: this device supports ?concurrent auto precharge?. when a read wi th auto precharge or a write with auto precharge is enabled any command may follow to the other banks as long as that command does not interrupt the read or write data transfer and all other limitations apply (e.g. contention between read data and write data must be avoided). the minimum delay from a read or write command with auto precharge enable, to a command to a different banks is summarized in table 13 . 10) a write command may be applied after the completion of data output. from command to command (different bank) minimum delay with concurrent auto precharge support unit write w/ap read or read w/ap 1 + (bl/2) + ru( t wtr / t ck ) 1) 1) ru means rounded to the next integer t ck write to write w/ap bl/2 t ck precharge or activate 1 t ck read w/ap read or read w/ap bl/2 t ck write or write w/ap ru(cl) 1) + bl/2 t ck precharge or activate 1 t ck
internet data sheet rev. 1.70, 2007-11 22 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram 4 electrical characteristics 4.1 operating conditions table 14 absolute maximum ratings attention: stresses above the max. value s listed here may cause permanent damage to the device. exposure to absolute maximum rating conditions for extended periods may affect device reliability. maximum ratings are absolute ratings; exceeding only one of these values may cause irreversible damage to the integrated circuit. parameter symbol values unit note/ test condition min. typ. max. voltage on i/o pins relative to v ss v in , v out ?0.5 ? v ddq + 0.5 v? voltage on inputs relative to v ss v in ?1 ? +3.6 v ? voltage on v dd supply relative to v ss v dd ?1 ? +3.6 v ? voltage on v ddq supply relative to v ss v ddq ?1 ? +3.6 v ? operating temperature (ambient) t a 0?+70 c? storage temperature (plastic) t stg -55 ? +150 c? power dissipation (per sdram component) p d ?1?w? short circuit output current i out ?50?ma?
internet data sheet rev. 1.70, 2007-11 23 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 15 input and output capacitances parameter symbol values unit note/ test condition min. typ. max. input capacitance: ck, ck c i1 1.5 ? 2.5 pf tsopii 1) 1) these values are guaranteed by design and are tested on a sample base only. v ddq = v dd = 2.5 v 0.2 v, f = 100 mhz, t a = 25 c, v out(dc) = v ddq /2, v out (peak to peak) 0.2 v. unused pins are tied to ground. 2.0 ? 3.0 pf tfbga 1) delta input capacitance c di1 ? ? 0.25 pf 1) input capacitance: all other input-only pins c i2 1.5 ? 2.5 pf tfbga 1) 2.0 ? 3.0 pf tsopii 1) delta input capacitance: all other input-only pins c dio ??0.5pf 1) input/output capacitance: dq, dqs, dm c io 3.5 ? 4.5 pf tfbga 1)2) 2) dm inputs are grouped with i/o pins reflecting the fact that t hey are matched in loading to dq and dqs to facilitate trace ma tching at the board level. 4.0 ? 5.0 pf tsopii 1)2) delta input/output capa citance: dq, dqs, dm c dio ??0.5pf 1)
internet data sheet rev. 1.70, 2007-11 24 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 16 electrical characteristics and dc operating conditions parameter symbol values unit note/test condition 1) 1) 0 c t a 70 c; v ddq = 2.5 v 0.2 v, v dd = +2.5 v 0.2 v; v ddq = 2.6 v 0.1 v, v dd = +2.6 v 0.1 v (ddr400); min. typ. max. device supply voltage v dd 2.3 2.5 2.7 v f ck 166 mhz device supply voltage v dd 2.5 2.6 2.7 v f ck > 166 mhz 2) 2) ddr400 conditions apply for all clock frequencies above 166 mhz output supply voltage v ddq 2.3 2.5 2.7 v f ck 166 mhz 3) 3) under all conditions, v ddq must be less than or equal to v dd . output supply voltage v ddq 2.5 2.6 2.7 v f ck > 166 mhz 2)3) eeprom supply voltage v ddspd 2.3 2.5 3.6 v ? supply voltage, i/o supply voltage v ss , v ssq 00v? input reference voltage v ref 0.49 v ddq 0.5 v ddq 0.51 v ddq v 4) 4) peak to peak ac noise on v ref may not exceed 2% v ref (dc). v ref is also expected to track noise variations in v ddq . i/o termination voltage (system) v tt v ref ? 0.04 v ref + 0.04 v 5) 5) v tt is not applied directly to the device. v tt is a system supply for signal terminati on resistors, is expected to be set equal to v ref , and must track variations in the dc level of v ref . input high (logic1) voltage v ih(dc) v ref + 0.15 v ddq + 0.3 v 6) 6) inputs are not recognized as valid until v ref stabilizes. input low (logic0) voltage v il(dc) ? 0.3 v ref ? 0.15 v 6) input voltage level, ck and ck inputs v in(dc) ? 0.3 v ddq + 0.3 v 6) input differential voltage, ck and ck inputs v id(dc) 0.36 v ddq + 0.6 v 6)7) 7) v id is the magnitude of the difference between the input level on ck and the input level on ck . vi-matching pull-up current to pull-down current vi ratio 0.71 1.4 ? 8) 8) the ratio of the pull-up current to the pull-down current is specified for the same temperature and voltage, over the entire temperature and voltage range, for device drain to source voltage from 0.25 to 1. 0 v. for a given output, it represents the maximum difference b etween pull-up and pull-down drivers due to process variation. input leakage current i i ?2 2 a any input 0 v v in v dd ; all other pins not under test =0v 9) 9) values are shown per pin. output leakage current i oz ?5 5 a dqs are disabled; 0v v out v ddq 9) output high current, normal strength driver i oh ? ?16.2 ma v out = 1.95 v output low current, normal strength driver i ol 16.2 ? ma v out = 0.35 v
internet data sheet rev. 1.70, 2007-11 25 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram 4.2 ac characteristics (notes 1-5 apply to the following tables; electrical charac teristics and dc operating conditions, ac operating conditions, i dd specifications and conditions, and electr ical characteristics and ac timing.)note note 1. all voltages referenced to v ss 2. tests for ac timing, i dd , and electrical, ac and dc characteristics, may be conducted at nominal reference/supply voltage levels, but the related specifications and device operation are guaranteed for the full voltage range specified. 3. figure 3 represents the timing reference load used in defining the relevant timing parameters of the part. it is not intended to be either a precise representation of the typical system environment nor a depiction of the actual load presented by a product ion tester. system designers will use ibis or other simulation tools to correlate the timing reference load to a system environment. manufacturers will correlate to their production test conditions (generally a coaxial transmission line terminated at the tester electronics). 4. ac timing and i dd tests may use a v il to v ih swing of up to 1.5 v in the test environment, but input timing is still referenced to v ref (or to the crossing point for ck, ck ), and parameter specifications are guaranteed for the specified ac input levels under normal use conditions. the minimum slew rate for the input signals is 1 v/ns in the range between v il(ac) and v ih(ac) . 5. the ac and dc input level specifications are as defined in the sstl_2 standard (i.e. the receiver effectively switches as a result of the signal crossing the ac input level, and remains in that state as long as the signal does not ring back above (below) the dc input low (high) level). 6. for system characteristics like setup & holdtime derating for slew rate, i/o delta rise/fall derating, ddr sdram slew rate standards, overshoot & undershoot specification and clamp v - i characteristics see the latest industry specification for ddr components. figure 3 ac output load circuit diagram / timing reference load 50 timing reference point output ( v out ) 30 pf v tt
internet data sheet rev. 1.70, 2007-11 26 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 17 ac timing - absolute specifications parameter symbol ?5 ?6 unit note/ test condition 1) ddr400b ddr333 min. max. min. max. dq output access time from ck/ck t ac ?0.5 +0.5 ?0.7 +0.7 ns 2)3)4)5) ck high-level width t ch 0.45 0.55 0.45 0.55 t ck 2)3)4)5) clock cycle time t ck 5 8 6 12 ns cl = 3.0 2)3)4)5) 6 12 6 12 ns cl = 2.5 2)3)4)5) 7.5 12 7.5 12 ns cl = 2.0 2)3)4)5) ck low-level width t cl 0.45 0.55 0.45 0.55 t ck 2)3)4)5) auto precharge write recovery + precharge time t dal ( t wr / t ck )+( t rp / t ck )t ck 2)3)4)5)6) dq and dm input hold time t dh 0.4 ? 0.45 ? ns 2)3)4)5) dq and dm input pulse width (each input) t dipw 1.75 ? 1.75 ? ns 2)3)4)5)6) dqs output access time from ck/ck t dqsck ?0.6 +0.6 ?0.6 +0.6 ns 2)3)4)5) dqs input low (high) pulse width (write cycle) t dqsl,h 0.35 ? 0.35 ? t ck 2)3)4)5) dqs-dq skew (dqs and associated dq signals) t dqsq ? +0.40 ? +0.40 ns tfbga 2)3)4)5) ? +0.40 ? +0.45 ns tsopii 2)3)4)5) write command to 1 st dqs latching transition t dqss 0.72 1.25 0.75 1.25 t ck 2)3)4)5) dq and dm input setup time t ds 0.4 ? 0.45 ? ns 2)3)4)5) dqs falling edge hold time from ck (write cycle) t dsh 0.2 ? 0.2 ? t ck 2)3)4)5) dqs falling edge to ck setup time (write cycle) t dss 0.2 ? 0.2 ? t ck 2)3)4)5) clock half period t hp min. ( t cl , t ch )? min. ( t cl , t ch )? ns 2)3)4)5) data-out high-impedance time from ck/ck t hz ? +0.7 ?0.7 +0.7 ns 2)3)4)5)7) address and control input hold time t ih 0.6 ? 0.75 ? ns fast slew rate 3)4)5)6)8) 0.7 ? 0.8 ? ns slow slew rate 3)4)5)6)8) control and addr. input pulse width (each input) t ipw 2.2 ? 2.2 ? ns 2)3)4)5)9)
internet data sheet rev. 1.70, 2007-11 27 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram address and control input setup time t is 0.6 ? 0.75 ? ns fast slew rate 3)4)5)6)8) 0.7 ? 0.8 ? ns slow slew rate 3)4)5)6)8) data-out low-impedance time from ck/ck t lz ?0.7 +0.70 ?0.70 +0.70 ns 2)3)4)5)7) mode register set command cycle time t mrd 2?2?t ck 2)3)4)5) dq/dqs output hold time t qh t hp ? t qhs ? t hp ? t qhs ?ns 2)3)4)5) data hold skew factor t qhs ? +0.50 ? +0.50 ns tfbga 2)3)4)5) ? +0.50 ? +0.55 ns tsopii 2)3)4)5) active to autoprecharge delay t rap t rcd ? t rcd ?ns 2)3)4)5) active to precharge command t ras 40 70e+3 42 70e+3 ns 2)3)4)5) active to active/auto-refresh command period t rc 55 ? 60 ? ns 2)3)4)5) active to read or write delay t rcd 15 ? 18 ? ns 2)3)4)5) average periodic refresh interval t refi ? 7.8 ? 7.8 s 2)3)4)5)8) auto-refresh to active/auto- refresh command period t rfc 65 ? 72 ? ns 2)3)4)5) precharge command period t rp 15 ? 18 ? ns 2)3)4)5) read preamble t rpre 0.9 1.1 0.9 1.1 t ck 2)3)4)5) read postamble t rpst 0.40 0.60 0.40 0.60 t ck 2)3)4)5) active bank a to active bank b command t rrd 10 ? 12 ? ns 2)3)4)5) write preamble t wpre 0.25 ? 0.25 ? t ck 2)3)4)5) write preamble setup time t wpres 0?0?ns 2)3)4)5)10) write postamble t wpst 0.40 0.60 0.40 0.60 t ck 2)3)4)5)11) write recovery time t wr 15 ? 15 ? ns 2)3)4)5) internal write to read command delay t wtr 2?1?t ck 2)3)4)5) exit self-refresh to non-read command t xsnr 75 ? 75 ? ns 2)3)4)5) exit self-refresh to read command t xsrd 200 ? 200 ? t ck 2)3)4)5)12) 1) 0 c t a 70 c; v ddq = 2.5 v 0.2 v, v dd = +2.5 v 0.2 v (ddr333); v ddq = 2.6 v 0.1 v, v dd = +2.6 v 0.1 v (ddr400) 2) input slew rate 1 v/ns for ddr400, ddr333 3) the ck/ck input reference level (for timing reference to ck/ck ) is the point at which ck and ck cross: the input reference level for signals other than ck/ck , is v ref . ck/ck slew rate are 1.0 v/ns. 4) inputs are not recognized as valid until v ref stabilizes. 5) the output timing reference level, as measured at the timing reference point indicated in ac characteristics (note 3) is v tt . 6) for each of the terms, if not already an integer, round to the next highest integer. t ck is equal to the actual system clock cycle time. parameter symbol ?5 ?6 unit note/ test condition 1) ddr400b ddr333 min. max. min. max.
internet data sheet rev. 1.70, 2007-11 28 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 18 ac timing - absolute specifications 7) t hz and t lz transitions occur in the same access time windows as valid data transitions. these parameters are not referred to a specific voltage level, but specify when the device is no longer driving (hz), or begins driving (lz). 8) fast slew rate 1.0 v/ns , slow slew rate 0.5 v/ns and < 1 v/ns for command/address and ck & ck slew rate > 1.0 v/ns, measured between v ih(ac) and v il(ac) . 9) these parameters guarantee device timing, but th ey are not necessarily tested on each device. 10) the specific requirement is that dqs be valid (high,low, or some point on a valid transition) on or before this ck edge. a v alid transition is defined as monotonic and meeting the input slew rate specificationsof the device. w hen no writes were previously in progress on the bus, dqs will be transitioning from hi-z to logic low. if a previous write was in progress, dqs could be high, low at this time , depending on t dqss . 11) the maximum limit for this parameter is not a device limit. the device operates with a greater value for this parameter, but system performance (bus turnaround) degrades accordingly. 12) parameter symbol ?7 unit note/test condition 1) ddr266a min. max. dq output access time from ck/ck t ac ?0.75 +0.75 ns 2)3)4)5) ck high-level width t ch 0.45 0.55 t ck 2)3)4)5) clock cycle time t ck 7.5 12 ns cl = 3.0 2)3)4)5) 7.5 12 ns cl = 2.5 2)3)4)5) 7.5 12 ns cl = 2.0 2)3)4)5) ck low-level width t cl 0.45 0.55 t ck 2)3)4)5) auto precharge write recovery + precharge time t dal ( t wr / t ck )+( t rp / t ck )? t ck 2)3)4)5)6) dq and dm input hold time t dh 0.5 ? ns 2)3)4)5) dq and dm input pulse width (each input) t dipw 1.75 ? ns 2)3)4)5)6) dqs output access time from ck/ck t dqsck ?0.75 +0.75 ns 2)3)4)5) dqs input low (high) pulse width (write cycle) t dqsl,h 0.35 ? t ck 2)3)4)5) dqs-dq skew (dqs and a ssociated dq signals) t dqsq ? +0.5 ns tsopii 2)3)4)5) write command to 1 st dqs latching transition t dqss 0.75 1.25 t ck 2)3)4)5) dq and dm input setup time t ds 0.5 ? ns 2)3)4)5) dqs falling edge hold time from ck (write cycle) t dsh 0.2 ? t ck 2)3)4)5) dqs falling edge to ck se tup time (write cycle) t dss 0.2 ? t ck 2)3)4)5) clock half period t hp min. ( t cl , t ch )ns 2)3)4)5) data-out high-impedance time from ck/ck t hz ?0.75 +0.75 ns 2)3)4)5)7) address and control input hold time t ih 0.9 ? ns fast slew rate 3)4)5)6)8) 1.0 ? ns slow slew rate 3)4)5)6)8) control and addr. input pulse width (each input) t ipw 2.2 ? ns 2)3)4)5)9) address and control input setup time t is 0.9 ? ns fast slew rate 3)4)5)6)8) 1.0 ? ns slow slew rate 3)4)5)6)8)
internet data sheet rev. 1.70, 2007-11 29 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram data-out low-impedance time from ck/ck t lz ?0.75 +0.75 ns 2)3)4)5)7) mode register set command cycle time t mrd 2? t ck 2)3)4)5) dq/dqs output hold time t qh t hp ? t qhs ns 2)3)4)5) data hold skew factor t qhs ? 0.75 ns tsopii 2)3)4)5) active to read w/ap delay t rap t rcd ?ns 2)3)4)5) active to precharge command t ras 45 120e+3 ns 2)3)4)5) active to active/auto-refresh command period t rc 65 ? ns 2)3)4)5) active to read or write delay t rcd 20 ? ns 2)3)4)5) average periodic refresh interval t refi 7.8 ? s 2)3)4)5)10) auto-refresh to active/auto-refresh command period t rfc 75 ? ns 2)3)4)5) precharge command period t rp 20 ? ns 2)3)4)5) read preamble t rpre 0.9 1.1 t ck 2)3)4)5) read postamble t rpst 0.4 0.6 t ck 2)3)4)5) active bank a to active bank b command t rrd 15 ? ns 2)3)4)5) write preamble t wpre 0.25 ? t ck 2)3)4)5) write preamble setup time t wpres 0?ns 2)3)4)5)11) write postamble t wpst 0.4 ? t ck 2)3)4)5)12) write recovery time t wr 15 ? ns 2)3)4)5) internal write to read command delay t wtr 1? t ck 2)3)4)5) exit self-refresh to non-read command t xsnr 75 ns 2)3)4)5)13) exit self-refresh to read command t xsrd 200 ? t ck 2)3)4)5) 1) v ddq = 2.5 v 0.2 v, v dd = +2.5 v 0.2 v ; 0 c t a 70 c 2) input slew rate 1 v/ns 3) the ck/ck input reference level (for timing reference to ck/ck ) is the point at which ck and ck cross: the input reference level for signals other than ck/ck , is v ref . ck/ck slew rate are 1.0 v/ns. 4) inputs are not recognized as valid until v ref stabilizes. 5) the output timing reference level, as measured at the timing reference point indicated in ac characteristics (note 3) is v tt . 6) for each of the terms, if not already an integer, round to the next highest integer. t ck is equal to the actual system clock cycle time. 7) t hz and t lz transitions occur in the same access time windows as valid data transitions. these parameters are not referred to a specific voltage level, but specify when the device is no longer driving (hz), or begins driving (lz). 8) fast slew rate 1.0 v/ns , slow slew rate 0.5 v/ns and < 1 v/ns for command/address and ck & ck slew rate > 1.0 v/ns, measured between v ih(ac) and v il(ac) . 9) these parameters guarantee device timing, but th ey are not necessarily tested on each device. 10) a maximum of eight autorefresh commands can be posted to any given ddr sdram device. 11) the specific requirement is that dqs be valid (high, low, or some point on a va lid transition) on or before this ck edge. a valid transition is defined as monotonic and meeting the input slew rate specifications of the device. when no writes were previously in progres s on the bus, dqs will be transitioning from hi-z to logic low. if a previous write was in pr ogress, dqs could be high, low, or transiti oning from high to low at this time, depending on t dqss . 12) the maximum limit for this parameter is not a device limit. the device operates with a greater value for this parameter, but system performance (bus turnaround) degrades accordingly. 13) in all circumstances, t xsnr can be satisfied using t xsnr = t rfc,min +1 t ck parameter symbol ?7 unit note/test condition 1) ddr266a min. max.
internet data sheet rev. 1.70, 2007-11 30 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 19 i dd conditions parameter symbol operating current: one bank; active/ precharge; t rc = t rcmin ; t ck = t ckmin ; dq, dm, and dqs inputs changing once per clock cycle ; address and control inputs changing once every two clock cycles. i dd0 operating current: one bank; active/read/precharge; burst = 4; refer to the following page for detailed test conditions. i dd1 precharge power-down standby current: all banks idle; power-down mode; cke v ilmax ; t ck = t ckmin i dd2p precharge floating standby current: cs v ihmin , all banks idle; cke v ihmin ; t ck = t ckmin , address and other control inputs changing once per clock cycle, v in = v ref for dq, dqs and dm. i dd2f precharge quiet standby current: cs v ihmin , all banks idle; cke v ihmin ; t ck = t ckmin , address and other control inputs stable at v ihmin or v ilmax ; v in = v ref for dq, dqs and dm. i dd2q active power-down standby current: one bank active; power-down mode; cke v ilmax ; t ck = t ckmin ; v in = v ref for dq, dqs and dm. i dd3p active standby current: one bank active; cs v ihmin ; cke v ihmin ; t rc = t rasmax ; t ck = t ckmin ; dq, dm and dqs inputs changing twice per clock cycle; address and control inputs changing once per clock cycle. i dd3n operating current: one bank active; burst = 2; reads; continuo us burst; address and control inputs changing once per clock cycle; 50% of data outputs changing on every clock edge; cl = 2 for ddr200 and ddr266a, cl = 3 for ddr333; t ck = t ckmin ; i out =0ma i dd4r operating current: one bank active; burst = 2; writes; continuous burst; address and control inputs changing once per clock cycle; 50% of data outputs changing on every clock edge; cl = 2 for ddr200 and ddr266a, cl = 3 for ddr333; t ck = t ckmin i dd4w auto-refresh current: t rc = t rfcmin , burst refresh i dd5 self-refresh current: cke 0.2 v; external clock on; t ck = t ckmin i dd6 operating current: four bank; four bank interleaving with bl = 4; refer to the following page for detailed test conditions. i dd7
internet data sheet rev. 1.70, 2007-11 31 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 20 i dd specification ?7 ?6 ?5 unit note/test condition 1) 1) test conditions for typical values: v dd = 2.5 v (ddr266, ddr333), v dd = 2.6 v (ddr400), t a = 25 c, test conditions for maximum values: v dd = 2.7 v, t a = 10 c ddr266a ddr333 ddr400b symbol typ. max. typ. max. typ. max. i dd0 65 78 75 90 80 100 ma 4/ 8 2)3) 2) i dd specifications are tested after the devic e is properly initialized and measured at 133 mhz for ddr266, 166 mhz for ddr333, and 2 00 mhz for ddr400. 3) input slew rate = 1 v/ns. 80 95 90 110 100 120 ma 16 3) i dd1 75 90 85 100 90 110 ma 4/ 8 3) 90 110 105 125 115 140 ma 16 3) i dd2p 1.5 4 1.6 4 1.7 4 ma 3) i dd2f 20 24 25 30 30 36 ma 3) i dd2q 15 21 17 24 19 26 ma 3) i dd3p 9 1311151216ma 3) i dd3n 29 35 35 41 39 47 ma 4/ 8 3) 31 37 37 44 42 50 ma 16 3) i dd4r 67 78 77 90 85 100 ma 4/ 8 3) 85 100 105 125 120 145 ma 16 3) i dd4w 71 83 81 95 90 105 ma 4/ 8 3) 90 105 110 130 125 150 ma 16 3) i dd5 170 205 185 220 205 245 ma 3)4) 4) enables on-chip refresh and address counters. i dd6 2.6 5.0 2.7 5.0 2.8 5.0 ma 3) 2.5 2.5 2.5 2.5 2.5 2.5 ma low power i dd7 204 243 234 279 260 310 ma 4/ 8 3) 215 255 255 310 285 340 ma 16 3)
internet data sheet rev. 1.70, 2007-11 32 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram 5 package outlines there are two package types used for this product family each in lead-free and lead-containing assembly: ? p-tfbga: plastic thin fine- pitch ball grid array package ? p-tsopii: plastic thin sm all outline package type ii figure 4 package outline of p(g)-tfbga-60  [     % [       0,1  0$; ? ? [ ? ? % 0 0 $ & 6($7,1* 3/$1( & &     & )32b3b7)%*$bb  &   0$;  %dg xqlw pdunlqj %80  3dfndjh rulhqwdwlrq pdun $  0lggoh ri sdfndjhv hgjhv  'xpp\sdgvzlwkrxwedoo  'lh vruw ilgxfldo  0$;   $
internet data sheet rev. 1.70, 2007-11 33 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram figure 5 package outline of p(g)-tsopii-66    ' r h v  q r w  l q f o x g h  s o d v w l f  s u r w u x v l r q  r i       p d [   s h u  v l g h    ' r h v  q r w  l q f o x g h  g d p e d u  s u r w u x v l r q  r i       p d [     ' r h v  q r w  l q f o x g h  s o d v w l f  r u  p h w d o  s u r w u x v l r q  r i       p d [   s h u  v l g h    ?           ?  ?    ?    ?  ?  ?     [                      ?           0   [         0 $;      0 $;  , q g h [  0 d u n l q j ?  ?    ?    ?  ?  ?       ?   ?            ?        ?           [ 6 ( $ 7, 1 *  3 /$1 ( ?        ?  0 , 1      * $ 8 * (  3 /$1 ( ) 3 2 b 3 b  7 6 2 3 , , b                       
internet data sheet rev. 1.70, 2007-11 34 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram table 1 performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 table 2 ordering information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 table 3 ordering information for rohs compliant products . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 table 4 pin configuration of ddr sdram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 table 5 abbreviations for pin type . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 table 6 abbreviations for buffer type . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 table 7 input/output functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 table 8 truth table 1a: commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 table 9 truth table 1b: dm operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 table 10 truth table 2: clock enable (cke). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 table 11 truth table 3: current state bank n - command to bank n (same bank) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 table 12 truth table 4: current state bank n - command to bank m (different bank). . . . . . . . . . . . . . . . . . . . . . . . . . 20 table 13 truth table 5: concurrent auto precharge. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 table 14 absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 table 15 input and output capacitances . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 table 16 electrical characteristics and dc operating conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 table 17 ac timing - absolute specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 table 18 ac timing - absolute specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 table 19 i dd conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 table 20 i dd specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 list of tables
internet data sheet rev. 1.70, 2007-11 35 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram figure 1 pin configuration p-tfbga-60 top vi ew, see the balls throught the package . . . . . . . . . . . . . . . . . . . . . . . . 12 figure 2 pin configuration p-tsopii-66-1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 figure 3 ac output load circuit diagram / timing reference load . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 figure 4 package outline of p(g)-tfbga-60 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 figure 5 package outline of p(g)-tsopii-66. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 list of figures
internet data sheet rev. 1.70, 2007-11 36 03062006-pffj-yjy2 hyb25d512[40/16/80]0b[e/f/c/t](l) double-data-rate sdram 1 overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 1.1 features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 1.2 description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 2 pin configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 3 functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 4 electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 4.1 operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 4.2 ac characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 5 package outlines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 list of tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 list of figures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 table of contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 table of contents
edition 2007-11 published by qimonda ag gustav-heinemann-ring 212 d-81739 mnchen, germany ? qimonda ag 2007. all rights reserved. legal disclaimer the information given in this internet data sheet shall in no ev ent be regarded as a guarantee of conditions or characteristics (?beschaffenheitsgarantie?). with respect to any examples or hi nts given herein, any typical values stated herein and/or any information regarding the application of the device, qimonda hereby disclaims any and all warranties and liabilities of any kin d, including without limitation warranties of non-infringem ent of intellectual property rights of any third party. information for further information on technology, delivery terms and conditio ns and prices please contact your nearest qimonda office. warnings due to technical requirements components may contain dangerous substances. for information on the types in question please contact your nearest qimonda office. qimonda components may only be used in life-support devices or systems with the express writte n approval of qimonda, if a failure of such components can reasonably be expected to cause the failure of that life-support devi ce or system, or to affect the safety or effectiveness of that device or system. life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. if they fail, it is re asonable to assume that the he alth of the user or other persons may be endangered. www.qimonda.com internet data sheet


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